Resistance calibration method without external precision elements

著录项

• 来源
  《IEEE East-West Design Test Symposium》|2014年|1-4|共4页
• 会议地点
• 作者

  Melikyan Vazgen; Sahakyan Arthur; Piloyan Mikayel; Hovhannisyan Gagik; Shishmanyan Aram; Hovhannisyan Taron; Trdatyan Davit;

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• 作者单位

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  calibration; electric resistance measurement; transmission lines; DDR; PCI; PVT compensated termination impedance; USB; accuracy precision discreet resistance; calibration code; double data rate; external precision element; peripheral component interconnect; process voltage and temperature; resistance 50 ohm; resistance calibration method; technologically accurate element; transmission line; universal serial bus; Accuracy; Calibration; Capacitors; Receivers; Reflection; Resistance; Resistors; comparator (COMP); compensation; multiplexor (MUX); precision; process, voltage and temperature (PVT); receiver (RX); reflection; resistance calibration; termination; transmitter (TX);

  机译：校准;电阻测量;传输线; DDR; PCI; PVT补偿的终端阻抗; USB;精度精确的分立电阻;校准代码;双倍数据速率;外部精度元件;外围组件互连;过程电压和温度;电阻50欧姆;电阻校准方法;技术上精确的元件;传输线;通用串行总线;精度;校准;电容器;接收器;反射率;电阻;电阻器;比较器（COMP）;补偿;多路复用器（MUX）;精度;过程，电压和温度（PVT） ;接收器（RX）;反射;电阻校准;端接;发射器（TX）;