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Nonvolatile Memory Devices With Magnetic Nanowires Controlled by Spin-Transfer and Spin-Orbit Torques

机译:具有通过自旋转移和自旋轨道转矩控制的磁性纳米线的非易失性存储设备

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Summary form only given. Efficient manipulation of magnetization direction in magnetic nanostructures is of crucial importance for realization of low-power and high-performance nonvolatile spintronics memory devices. Spin-transfer torque (STT) induced magnetization switching in magnetic nanopillars, or magnetic tunnel junctions, has been a leading technology in this field and is about to hit the market as a spin-transfer torque magnetoresistive random access memory (STT-MRAM). In STT-MRAM, the memory element typically has two terminals and magnetization is switched through a spin angular momentum transfer by applying vertical currents. In the meantime, recent researches have opened another possibility of nonvolatile spintronics devices with magnetic nanowires, where the magnetization is controlled by horizontal currents. Such devices typically form a three-terminal architecture [1] and magnetization can be controlled by current-induced domain wall (DW) motion [2, 3] or spin-orbit torque (SOT) induced magnetization switching [4, 5]. The three-terminal architecture provides a relaxed control of parameters and potential to operate at higher frequency at the cost of cell size compared with the two-terminal counterpart, making the devices an attractive option for integrated-circuits applications [1]. In terms of physics, moreover, the above two schemes complete magnetization switching with characteristic dynamics by torques with a different symmetry from the STT switching, offering unique attributes that are not seen in STT switching. In this presentation, we show recent advances in controlling the magnetization of nanowires via the DW motion and SOT switching. We particularly focus on the characteristic features of the SOT switching and discuss their impact on integrated circuit applications. One of the unique aspects of SOT is an orthogonal relation with the Gilbert damping torque when one utilizes perpendicular easy axis systems. For STT devices, because the damping torque acts in the antiparallel direction to STT, one needs to employ material systems with low damping, which in general has positive correlation with magnetic anisotropy that ensures thermal stability. For SOT devices, on the other hand, due to the orthogonal relation, one can employ high anisotropy materials even with high damping. As a result, electrically controllable memory elements with high thermal stability are expected. We have studied a SOT switching in nanowires with a Co/Pt multilayer having a high magnetic anisotropy and damping [6]. The fabricated nanowire devices show high thermal stability factor, given by a ratio of the energy barrier to the thermal fluctuation energy, of much greater than 100, and magnetization switching driven by current. In addition, we have found that a switching efficiency, defined as an anisotropy energy density divided by switching current density, increases with the stacking number of Co/Pt bilayer. This fact suggests that the SOT is generated in the Co/Pt multilayer despite a structural inversion symmetry, implying an unknown mechanism of SOT generation, as pointed out in a previous work [7]. The obtained results show promise for use in integrated circuits used in wide temperature ranges. The SOT acting in the orthogonal direction to the damping torque also provides a high-speed magnetization switching capability. The STT switching proceeds with a precessional motion and its threshold current is known to increase with an inverse of pulse duration below about a few nanoseconds. In contrast, for the case with SOT, a theory predicts an immediate magnetization switching as soon as the torque is exerted, resulting in a less pulse duration dependence of the switching current [8]. To elucidate this difference experimentally, we have studied a pulse duration dependence of the switching current density for two kinds of in-plane magnetized geometries; one shows switching as in the case for STT switching [5] and the other is expected to show a switching by orthogonal spins [9]. It was found that the latter scheme shows virtually constant switching current density with respect to the pulse duration down to 0.5 ns [10]. This result indicates the potential of SOT switching for high-speed memory operated at GHz class. We have also studied the pulse duration dependence of switching current density for perpendicular easy axis systems with W/CoFeB/MgO stacks [11]. In this experiment, we prepared several devices with various sizes to systematically examine the effect of an incoherent reversal with a DW propagation, which is expected to be significant in perpendicular easy axis systems. It was found that, for micrometer-scaled devices, the switching current density significantly decreases with increasing the pulse duration due to the incoherent reversal. The detailed investigation reveals that the nucleation events take place at various sites inside the magnetic dot or wires, and the switching completes by DW propagation among the sites. For devices with a CoFeB/MgO nanodot formed on a W nanowire, on the other hand, less pulse duration dependence of switching current density was observed as in the case for the in-plane system. Thus, the speed of SOT switching crucially depends on the employed device geometry for perpendicular easy axis systems.
机译:仅提供摘要表格。磁性纳米结构中磁化方向的有效操纵对于实现低功耗和高性能非易失性自旋电子存储设备至关重要。自旋传递转矩(STT)引起的磁性纳米柱或磁性隧道结中的磁化转换已成为该领域的领先技术,并将以自旋传递转矩磁阻随机存取存储器(STT-MRAM)进入市场。在STT-MRAM中,存储元件通常具有两个端子,并且通过施加垂直电流通过自旋角动量传递来切换磁化强度。同时,最近的研究为具有磁性纳米线的非易失性自旋电子器件打开了另一种可能性,其中磁化强度由水平电流控制。这样的设备通常形成三端架构[1],并且磁化强度可以通过电流感应畴壁(DW)运动[2、3]或自旋轨道转矩(SOT)感应磁化强度开关[4、5]进行控制。与两端架构相比,三端架构可轻松控制参数和在较高频率下运行的潜力,但以单元尺寸为代价,从而使该器件成为集成电路应用的诱人选择[1]。此外,就物理而言,上述两种方案通过具有与STT切换不同的对称性的转矩来完成具有特性动力学的磁化切换,从而提供了STT切换中未见的独特属性。在本演示中,我们展示了通过DW运动和SOT开关控制纳米线磁化的最新进展。我们特别关注SOT开关的特性,并讨论它们对集成电路应用的影响。 SOT的独特之处之一是,当使用垂直易轴系统时,其与吉尔伯特阻尼转矩的正交关系。对于STT装置,由于阻尼转矩沿与STT反向平行的方向起作用,因此需要采用低阻尼的材料系统,该系统通常与确保热稳定性的磁各向异性成正相关。另一方面,对于SOT器件,由于正交关系,即使具有高阻尼,也可以采用高各向异性材料。结果,期望具有高热稳定性的电可控存储元件。我们已经研究了具有Co / Pt多层的纳米线中的SOT开关,该多层具有高的磁各向异性和阻尼[6]。所制造的纳米线器件显示出高的热稳定性因数,该热稳定性因数由能垒与热波动能量之比(远大于100)给出,并且由电流驱动磁化强度。此外,我们发现,转换效率(定义为各向异性能量密度除以开关电流密度)随Co / Pt双层堆叠数的增加而增加。这一事实表明,尽管存在结构反转对称性,但SOT是在Co / Pt多层中生成的,这暗示了SOT生成的未知机制,如先前的工作所指出的[7]。所获得的结果表明有望在宽温度范围内使用的集成电路中使用。在与阻尼扭矩正交的方向上作用的SOT还提供了高速磁化切换功能。 STT切换以进动方式进行,并且已知其阈值电流会随着脉冲持续时间的倒数在大约几纳秒以下而增加。相反,对于具有SOT的情况,一种理论预测,一旦施加扭矩,就会立即进行磁化切换,从而减小了开关电流对脉冲持续时间的依赖性[8]。为了通过实验阐明这种差异,我们研究了两种平面内磁化几何形状对开关电流密度的脉冲持续时间依赖性。一个表示与STT切换[5]相同的切换,另一个表示通过正交自旋[9]进行的切换。已经发现,后一种方案相对于低至0.5 ns的脉冲持续时间显示出几乎恒定的开关电流密度[10]。该结果表明SOT切换对于以GHz级运行的高速存储器的潜力。我们还研究了带有W / CoFeB / MgO堆叠的垂直易轴系统的开关电流密度与脉冲持续时间的相关性[11]。在本实验中,我们准备了几种尺寸各异的设备,以系统地检查具有DW传播的非相干反转的影响,这在垂直易轴系统中有望发挥重要作用。已经发现,对于微米级设备,由于不相干的反转,开关电流密度随着脉冲持续时间的增加而显着降低。详细的调查表明,成核事件发生在磁点或导线内部的各个位置,并且切换将通过站点之间的DW传播来完成。另一方面,对于在W纳米线上形成CoFeB / MgO纳米点的器件,如在平面系统中,观察到的开关电流密度对脉冲持续时间的依赖性较小。因此,SOT切换的速度主要取决于垂直易轴系统所采用的器件几何形状。

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