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Automated Measuring Unit for Analysis of Thin Magnetic Film Ferroresonance Spectrum

机译:自动测量装置,用于分析磁性薄膜铁磁谐振谱

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This paper considers hardware and software for automated analysis of thin magnetic film ferroresonance spectrum to determine the rate of growth and decrease in ferroresonance spectrum (conversion factor parameter). The measuring element of automated system is the strip line which is short-circuited. The measuring unit is used to study Ni80Fe20 permalloy films, with thickness of more than 300 Å. Conversion factor, magnetic permeability μ, uniaxial magnetic anisotropy, ferromagnetic spectrum resonance line width, saturation magnetization are analyzed from 50 MHz to 2 GHz frequency range. The magnetic films are used to design frequency selective filters, phase shifters and weak-field magnetic sensors. The thin magnetic film sensors are high sensitive magnetometers, with wide frequency range, low dimensions and weight [1].
机译:本文考虑了用于自动分析磁性薄膜铁磁谐振谱的硬件和软件,以确定铁磁谐振谱的增长和减小的速率(转换因子参数)。自动化系统的测量元件是带状线是否短路。测量单位用于研究镍 80 20 坡莫合金膜,厚度超过300Å。分析了从50 MHz到2 GHz频率范围的转换因子,磁导率μ,单轴磁各向异性,铁磁谱共振线宽度,饱和磁化强度。磁性膜用于设计频率选择滤波器,移相器和弱磁场磁传感器。磁性薄膜传感器是高灵敏度磁力计,具有宽频率范围,低尺寸和重量[1]。

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