首页> 外文会议>Electronic Components and Technology Conference, 1995. Proceedings., 45th >Performance and reliability of a three-dimensional plastic mouldedvertical multichip module (MCM-V)
【24h】

Performance and reliability of a three-dimensional plastic mouldedvertical multichip module (MCM-V)

机译:三维塑料成型的性能和可靠性垂直多芯片模块(MCM-V)

获取原文

摘要

The performance and reliability of a low-cost three-dimensionalplastic moulded vertical multi-chip module concept is presented.Performance was evaluated using custom designed chips incorporatingthermal, thermomechanical, electrical and reliability test structures.Results of performance are presented and are shown to correlate wellwith thermal, thermomechanical and electrical simulations. The thermaland thermomechanical performances are sufficient to allow use of theMCM-V technique in a wide range of applications without the need forspecial cooling techniques. Reliability testing to space level standardswas carried out on 53 technology demonstrator modules incorporating thetest chips and a high level of reliability has been demonstrated
机译:低成本三维的性能和可靠性 提出了塑料成型的垂直多芯片模块概念。 使用结合了定制设计的芯片来评估性能 热,热机械,电气和可靠性测试结构。 展示了性能结果,并显示出很好的相关性 进行热,热机械和电仿真。散热 和热机械性能足以允许使用 MCM-V技术可在多种应用中实现,而无需 特殊的冷却技术。符合空间标准的可靠性测试 是在53个技术演示模块上进行的,其中包含 测试芯片和高可靠性已被证明

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号