首页> 外文会议>Electronic Components and Technology Conference, 1995. Proceedings., 45th >Craze and instability of polyimide thin films and its effects onhigh density interconnects
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Craze and instability of polyimide thin films and its effects onhigh density interconnects

机译:聚酰亚胺薄膜的开裂和不稳定性及其对薄膜的影响高密度互连

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摘要

Stress-strain oscillation occurred prior to the appearance ofnecking deformation in tensile tests of polyimide films. Thisoscillation appears to be related to initiation and propagation ofcraze, rather than neck deformation. Both temperature and strain ratehave a significant affect on oscillation. The effects of crazeinitiation and propagation on reliability of high density interconnectsare discussed
机译:应力-应变振荡发生在出现之前 聚酰亚胺薄膜拉伸试验中的颈缩变形。这 振荡似乎与启动和传播有关 热潮,而不是颈部变形。温度和应变率 对振荡有重大影响。狂热的影响 密度互连的可靠性的初始化和传播 被讨论

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