首页> 外文会议>Electronic Components and Technology Conference, 1995. Proceedings., 45th >Reflowable Sn-Pb bump formation on Al pad by a solder bumpingmethod
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Reflowable Sn-Pb bump formation on Al pad by a solder bumpingmethod

机译:通过焊料凸点在铝焊盘上形成可回流的Sn-Pb凸点方法

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A new solder bump material for reflow soldering on an Al pad wasdeveloped by using a rapidly solidified 60 Sn-29 Pb-5 Sb-1 Zn-5Ag(mass%) alloy wire. The balls made from the wire by arc discharge inAr+10%H2 gas were bonded on an Al-1mass%Si film bythermosonic bonding at 398 K using a wire bonding machine. The bondingto the Al-Si film was made by the interdiffusion of Sn, Sb, Ag and Althrough microfissures which occurred on the film surface. The as-bondedbump can be spheroidized by heating at 473 K with an inactivated rosinbase flux. The shear strength of the reflowed bump is 79 MPa anddecreases with increasing reflow temperature. According to the thermalfatigue life test of the solder bump applied to the flip-chip bonding,the striations formed by the fatigue fracture were observed to generateat very fine intervals of 0.08-0.12 μm. These results are good enoughto expect practical application of the direct solder bump formationtechnique on Al pad
机译:一种用于在Al焊盘上进行回流焊接的新型焊料凸点材料是 通过使用快速固化的60 Sn-29 Pb-5 Sb-1 Zn-5进行开发 Ag(质量%)合金丝。通过电弧放电将金属丝制成的球 Ar + 10%H 2 气体通过以下方式键合在Al-1质量%Si膜上 使用引线键合机在398 K进行热超声键合。粘接 通过Sn,Sb,Ag和Al的互扩散制备Al-Si膜 通过薄膜表面发生的微裂缝。保税区 可以通过用灭活的松香在473 K的温度下加热使球体球形化 基本通量。回流焊块的剪切强度为79 MPa, 随回流温度的升高而降低。根据热 应用于倒装芯片焊接的焊料凸块的疲劳寿命测试, 观察到由疲劳断裂形成的条纹产生 以0.08-0.12μm的非常精细的间隔。这些结果足够好 期待直接形成焊料凸块的实际应用 铝垫上的技术

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