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首页> 外文会议>Conference on Novel Optical Systems, Methods, and Applications >Effects of light intensity on disparity for depth extraction in monochrome CMOS image sensor with offset pixel apertures
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Effects of light intensity on disparity for depth extraction in monochrome CMOS image sensor with offset pixel apertures

机译：光强度对用偏移像素孔的单色CMOS图像传感器深度提取的差异

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摘要

Effects of light intensity on disparity for depth extraction in monochrome CMOS image sensor with offset pixelapertures are investigated. The technology consumes less power, since it does not use external light sources. The offsetpixel apertures are integrated in each pixel of the monochrome CMOS image sensor to acquire the disparity for depthextraction. Because the monochrome CMOS image sensor does not contain color filters, the height of the pixel is lowerthan that of the CMOS image sensor with color filters, resulting in a better disparity. The monochrome CMOS imagesensor with offset pixel apertures was designed and fabricated using 0.11 μm CMOS image sensor process. Disparity ofthe sensor has been measured under various light intensities. The sensor might be useful for three-dimensional imagingin outdoor applications with a simple structure.
机译：光强度对用偏移像素的单色CMOS图像传感器深度萃取差异的影响对孔进行调查。该技术消耗较少的力量，因为它不使用外部光源。偏移量像素孔集成在单色CMOS图像传感器的每个像素中，以获取深度的视差萃取。因为单色CMOS图像传感器不包含滤色器，所以像素的高度较低而不是CMOS图像传感器的滤色器，导致更好的差异。单色CMOS图像使用0.11μmCMOS图像传感器工艺设计和制造具有偏移像素孔的传感器。差异传感器已经在各种光强度下测量。传感器可能对三维成像有用在具有简单结构的户外应用中。

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