首页> 外文会议>IEEE Radiation Effects Data Workshop;IEEE Nuclear and Space Radiation Effects Conference >Trend in Measured SEL Sensitivity with Increasing Proton Induced Total Ionizing Dose to1Mrad(Si) on Zynq UltraScale Plus XCZU9EG FPGA
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Trend in Measured SEL Sensitivity with Increasing Proton Induced Total Ionizing Dose to1Mrad(Si) on Zynq UltraScale Plus XCZU9EG FPGA

机译:测量SEL敏感性的趋势随着质子诱导的全电离剂量在Zynq UltraScale加上XCZu9G FPGA上的全电离剂量

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摘要

Experimental observation of the trend in SEL sensitivity was made for increasing proton induced TID/DD. The test samples were the Zynq Ultrascale Plus XCZU9EG FPGAs. The cumulative TID on one sample was near 1 Mrad(Si).
机译:对增加质子诱导的TID / DD进行SEL敏感性趋势的实验观察。测试样品是Zynq UltraScale加XCZu9GFPGA。一个样品上的累积TID接近1mrad(Si)。

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