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An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme

机译:一种使用扫描链压实和基于词典方案的有效混合测试数据压缩方法

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In this paper, we propose a new test data compression method for reducing test data volume and test application time. The proposed method consists of two steps: scan chain compaction and dictionary-based compression scheme. The scan chain compaction provides a minimum scan chain depth by using compaction of the compatible scan cells in the scan chain. The compacted scan chain is partitioned to the multiple internal scan chains for using the fixed-length index dictionary-based compression scheme that provides the high compression ratio and the fast testing time. The proposed compression method delivers compressed patterns from the ATE to the chip and drives a large number of multiple internal scan chains using only a single ATE input and output. Experimental results for the ISCAS-89 test benches show that the test data volume and testing time for the proposed method are less than previous compression schemes.
机译:在本文中,我们提出了一种新的测试数据压缩方法,用于减少测试数据量和测试时间。所提出的方法包括两个步骤:扫描链压缩和基于字典的压缩方案。通过使用扫描链中的兼容扫描单元的压实,扫描链压缩提供最小扫描链深度。压实的扫描链被划分为多内部扫描链,以使用基于固定长度索引字典的压缩方案,该压缩方案提供高压缩比和快速测试时间。所提出的压缩方法将来自ATE的压缩模式传递到芯片,并且仅使用单个ATE输入和输出驱动大量多个内部扫描链。 ISCAS-89测试台的实验结果表明,所提出的方法的测试数据量和测试时间小于先前的压缩方案。

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