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Crystal size and crystallinity : X-ray diffraction and electron microscopy versus raman vibrational spectroscopy

机译：晶体尺寸和结晶度：X射线衍射和电子显微镜与拉曼振动光谱

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The interest of low-frequency Raman scattering for the determination of average particle size and the study of material organization at the nanometric scale is shown. The potentialities of high frequency scattering data for the assessment of short-range to long-range crystal order are emphasized.

机译：显示了低频拉曼散射用于测定平均粒度和纳米级材料组织研究的兴趣。强调了用于评估短程与远程晶体顺序的高频散射数据的潜力。

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《Conference on applied crystallography》|1998年||共5页
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M. Boudeulle; B. Champagnon; C. Chemarin; E. Duval; Y. Guyot; J. Mugnier; L. Saviot; G. Panczer;
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中图分类晶体学;
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Crystal size and crystallinity : X-ray diffraction and electron microscopy versus raman vibrational spectroscopy

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