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A new approach to examine interfacial interaction potential between a thin solid film or a droplet and a smooth substrath

机译:一种研究薄实心膜或液滴和平滑底层之间的界面相互作用电位的新方法

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Atomic force microscopy (AFM) technique has been successfully used to study the sublimation rate of explosive solid film on a smooth surface. Based ont he experimental results, a dipole-induced dipole propagation potential is employed to explain a nonlinear sublimation rate of solid TNT thin film very close to the interface. In this model, three important physical parameters, bulk TNT sublimation rate #delta#_o, surface interaction potential U_o and the effective range of the surface potential h_o, are introduced with no arbitrary constants. It is argued that this type of model reflects a general phenomena rather than a special case. This model has been further extended to describe the evaporation rate of liquid droplets resting on a smooth surface. It is also demonstrated that tapping mode AFM is capable of imaging highly viscous explosive droplets under ambient conditions.
机译:原子力显微镜(AFM)技术已成功地用于研究光滑表面上爆炸实体膜的升华速率。基于实验结果,采用偶极诱导的偶极传播电位来解释非常接近界面的固体TNT薄膜的非线性升华速率。在该模型中,三个重要的物理参数,散装TNT升华速率#delta#_o,表面相互作用u_o和表面电位h_o的有效范围,没有任意常数。认为这种类型的模型反映了一般现象而不是特殊情况。该模型进一步扩展以描述在光滑的表面上搁置液滴的蒸发速率。还证明了攻丝模式AFM能够在环境条件下成像高度粘性的爆炸液滴。

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