Two-color two-step laser ionization spectroscopy of uranium sputtered from thin metallic films

机译：铀的双色两步激光电离光谱从薄金属薄膜溅射

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Resonance ionization mass spectrometry (RIMS) was used to obtain state selective information on uranium atoms released from thin films by keV ion beam bombardment. First experiments were conducted to evaluate double-resonant laser ionization schemes. The high selectivity of such ionization schemes is further illustrated by comparing the flight-time distributions of the sputtered particles obtained both by resonant and non-resonant multiphoton (355 nm) laser post-ionization.

机译：共振电离质谱（边缘）用于通过KEV离子束轰击从薄膜释放的铀原子的状态选择性信息。进行第一实验以评估双共振激光电离方案。通过比较通过谐振和非共振多相（355nm）激光器后电离的溅射颗粒的飞行时间分布来进一步说明这种电离方案的高选择性。

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《International Symposium on Resonance Ionization Spectroscopy and Its Applications》|2001年||共4页
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E. Vandeweert; V. Philipsen; P. Lievens; R. E. Silverans; C. Gruning; F. Miserque; M. Betti; T. Gouder; N. Erdmann;
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1. Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles: Evaluation of a combined system for particle trace analysis [J] . Erdmann N., Betti M., Kollmer F., Analytical chemistry . 2003,第13期

机译：薄膜和单个微粒中溅射出的铀原子的共振和非共振激光电离：颗粒痕量分析组合系统的评估
2. Electronic processes during the sputtering of atoms from metallic surface studied by resonance laser ionization spectroscopy [J] . Jeroen Bastiaansen, Frederik Vervaecke, Erno Vandeweert, Spectrochimica Acta, Part B. Atomic Spectroscopy . 2003,第6期

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3. Optical properties and laser-induced breakdown spectroscopy analysis of Al- or Co-doped CuO thin films prepared on glass by radio-frequency magnetron sputtering [J] . Wu Jiasen, Gao Qing, Wei Gongxiang, Thin Solid Films . 2021,第Mara31期

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4. Two-color two-step laser ionization spectroscopy of uranium sputtered from thin metallic films [C] . E. Vandeweert, V. Philipsen, P. Lievens, International Symposium on Resonance Ionization Spectroscopy and Its Applications . 2001

机译：铀的双色两步激光电离光谱从薄金属薄膜溅射
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机译：用于放射性同位素的气体中激光电离和光谱的两步激光电离方案

Two-color two-step laser ionization spectroscopy of uranium sputtered from thin metallic films

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