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Microstructural Aspects of Ionic Conductivity in Yttria and Magnesia Stabilised Zirconia

机译:氧化钇和镁质稳定氧化锆的离子电导率的微观结构方面

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The paper presents the result of investigations on microstructural and electrical properties changes in yttria-zirconia, and yttria-magnesia-zirconia solid solutions. These changes were caused by heat-treatment of the material and lead to the diffusion-induced grain-boundary migration phenomenon (DIGM). Chemical in-homogeneity, due to the higher stabiliser ion content leads simultaneously to the ionic conductivity increase and to the larger distance of migration of grain boundaries.
机译:本文介绍了在氧化钇 - 氧化锆的微观结构和电性能变化的研究结果,以及氧化YtTria-magnesia-Zirconia固溶体。这些变化是由材料的热处理引起的,并导致扩散诱导的晶界迁移现象(DIGM)。化学均匀性,由于较高的稳定剂离子含量同时引入离子电导率和晶界迁移的较大距离。

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