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Measurements of ions emission using ToF method and CR39 SSNTD in a Small Plasma Focus device of Hundreds of Joules

机译:使用TOF法测量离子法和CR39 SSNTD在数百焦耳的小等离子体聚焦装置中

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Ion beam emission in plasma focus (PF) discharges was originally investigated to explain the strong forward anisotropy observed in the neutron emission when D_2 is used as filling gas in the PF devices. Several properties of emitted deuteron beam, including its angular distribution and energy spectra in PF devices operating at energies from 1kJ to 1MJ, have been measured. At present there is a growing interest in the development of very small PF devices operating under 1kJ. As part of the very low energy (< 1kJ) PF devices physics characterization program carried out at the Chilean Nuclear Energy Commission, the charged particle emission is being studied when hydrogen (H_2) and mixture (H_(2+) %Ar) is used as filling gas in the PF device. The experiments have been performed in a plasma focus device of 400 joules (PF-400J). In order to estimate the ion beam energy spectrum and its ionization degree, by means of the time of flight method, a graphite collector system operating in the bias ion collector mode was constructed. On the other hand, measurements of the energy and flux of the ions have been corroborated using CR39 SSNTD. Preliminary results mainly show the presence of hydrogen ions with an average energy of 40keV. Also, in some cases, copper (from anode) and aluminum (from insulator) ions with energies lower than 1keV have been observed.
机译:最初研究了等离子体聚焦(PF)放电中的离子束发射,以说明当D_2用作PF器件中的填充气体时,在中子发射中观察到的强向各向异性。已经测量了发射的氘梁的几个特性,包括在从1KJ至1MJ的能量下操作的PF器件中的角分布和能谱。目前,对在1KJ下运行的非常小的PF器件的开发越来越感兴趣。作为非常低的能量(<1KJ)PF器件物理表征程序的一部分,当使用氢气(H_2)和混合物(H_(2+)%AR)时,正在研究带电粒子发射作为PF器件中的填充气体。已经在400焦耳的等离子体聚焦装置中进行了实验(PF-400J)。为了估计离子束能谱及其电离程度,通过飞行方法的时间,构造了在偏置离子收集器模式中操作的石墨集电体系。另一方面,使用CR39 SSNTD已经证实了离子的能量和通量的测量。初步结果主要显示出氢离子的存在,具有40KeV的平均能量。此外,在一些情况下,已经观察到,已经观察到已经观察到具有低于1KeV的能量低于1KeV的铜(来自阳极)和铝(来自绝缘体)离子。

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