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首页> 外文会议>Japan International SAMPE Symposium and Exhibition >PHOTO-STIMULATED RAMAN AND FLUORESCENCE SPECTRA OF CERAMIC PEROVSKITE STRUCTURES: A COMPARISON BETWEEN BLUE- AND RED-LINE EXCITATION
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PHOTO-STIMULATED RAMAN AND FLUORESCENCE SPECTRA OF CERAMIC PEROVSKITE STRUCTURES: A COMPARISON BETWEEN BLUE- AND RED-LINE EXCITATION

机译：陶瓷钙钛矿结构的光刺激拉曼和荧光光谱：蓝色和红线激励之间的比较

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Multilayer ceramic capacitors are widely applied in many electronic products in our daily life, given their related benefits of high performance. However, residual stresses arise from the process of co-firing metallic internal electrodes and BaTiO{sub}3 (BT) based dielectrics, which affect the performance and reliability of these devices. The spectral band positions of the photoluminescence spectrum of Ho{sup}(3+) dopant in BT shift with stress, this phenomenon being referred to as the Piezo-Spectroscopic (PS) effect. We investigated about the stress sensitivity of the photoluminescence spectrum of Ho{sup}(3+) dopant in BT by means of a Raman microprobe with exitation sources of: (a) a Kr laser that operated at a wavelength 647 nm; and, (b) an Ar-ion laser operated at a wavelength 488 nm. From a comparison between the fluorescence spectra observed by different irradiation wavelengths on the same material, we discuss about the efficiency of the spectroscopic assessment and about the suitability of different excitation wavelengths for piezo-spectroscopic stress assessments.
机译：鉴于其高性能相关的益处，多层陶瓷电容器广泛应用于我们日常生活中的许多电子产品。然而，从共用金属内部电极和BATIO {SUB} 3（BT）的电介质的过程中出现残余应力，这影响了这些器件的性能和可靠性。 HO {sup}（3+）掺杂剂在BT偏移中的光致发光光谱的光谱带位置，这种现象被称为压电谱（PS）效应。我们研究了HO {SUP}（3+）掺杂剂在BT中的光致发光光谱的应力敏感性，通过拉曼微探测器，其具有：（a）在波长647nm处操作的KR激光器;并且（b）在波长488nm处操作的Ar离子激光器。从相同材料上观察到的不同照射波长观察到的荧光光谱的比较，我们讨论了光谱评估的效率以及关于压电光谱应激评估的不同激发波长的适用性。

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