首页> 外文会议>IEEE International Symposium on the Applications of Ferroelectrics >Crystalline and Ferroelectric Properties of 0.68BiFeO{sub}3-0.32PbTiO{sub}3 Multiferroic Thin Film Prepared by Sol-Gel Method
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Crystalline and Ferroelectric Properties of 0.68BiFeO{sub}3-0.32PbTiO{sub}3 Multiferroic Thin Film Prepared by Sol-Gel Method

机译:0.68bifeo {sub} 3-0.32pbtio {sub} 3的结晶和铁电性能3-0.32pbtio {}溶胶 - 凝胶法制备的多体薄膜

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0.68BiFeO{sub}3-0.32PbTiO{sub}3 (BFPT) films were prepared on SiO{sub}2/Si and Pt/Ti/SiO{sub}2/Si substrates by sol-gel method. The XRD patterns of BFPT films show that BFPT films have good crystalline properties, and there are no other peaks of impure phases except for the peaks of BFPT thin film and the substrates. The thickness of BFPT thin films that annealed at 600? for 10 min was about 860 nm when deposited 8 layers. The clear interface is observed between BFPT film and the substrate. The remanent polarization of BFPT was rather high, and the P{sub}r value was about 70μC/cm{sup}2.
机译:通过溶胶 - 凝胶法在SiO {Sub} 2 / Si和Pt / Ti / Si {Sub} 2 / Si衬底上制备0.68bifeo {sub} 3-0.32pbtio {sub} 3(bfpt)薄膜。 BFPT薄膜的XRD图案表明,BFPT膜具有良好的结晶性能,除了BFPT薄膜和基材的峰之外,没有其他纯度的纯度峰。 BFPT薄膜的厚度在600时退火?沉积8层时,10分钟约为860nm。在BFPT膜和基板之间观察到透明界面。 BFPT的再现极化相当高,P {Sub} R值为约70μC/ cm {sup} 2。

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