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Remaining Useful Life Prediction of Electronic Products Based on Wiener Degradation Process

机译：基于维纳劣化过程的电子产品剩余使用寿命预测

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摘要

This paper address the remaining useful life (RUL) prediction of electronic products based on wiener degradation process model and Bayesian posterior estimation. Considering the randomness and individual difference of performance degradation process of electronic products, the degradation process can be modeled and analyzed based on the Wiener process. Combining with the historical degradation data of other similar products as the prior information, posterior parameters can be estimated by using the degradation information of the target product through Bayesian estimation through the RUL distribution of the first hitting time (FHT). It can realize real-time update of parameters. Then the RUL of target electronic product can be estimated. It can improve the accuracy of RUL prediction to a certain extent. The feasibility of the method is verified by a practical example of GaAs lasers.
机译：本文根据维纳劣化过程模型和贝叶斯后估计，解决了电子产品的剩余使用寿命（RUL）预测。考虑到电子产品性能劣化过程的随机性和各个差异，可以基于维纳过程进行模拟和分析劣化过程。与其他类似产品的历史降解数据相结合作为先前信息，可以通过使用贝叶斯估计通过第一击球时间（FHT）的RUL分布来估计后参数。它可以实现参数的实时更新。然后可以估计目标电子产品的rul。它可以在一定程度上提高RUL预测的准确性。通过GaAs激光器的实际示例来验证该方法的可行性。

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