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首页> 外文会议>International Conference on Applied Human Factors and Ergonomics >Improving Quality Control of Mechatronic Systems Using KPI-Based Statistical Process Control
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Improving Quality Control of Mechatronic Systems Using KPI-Based Statistical Process Control

机译：基于KPI的统计过程控制改善机电系统的质量控制

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Statistical Process Control (SPC) is a quality control instrument for the manufacturing of mechatronic systems that enables to detect minor deviations within the manufactured products to prevent serious quality issues and financial loss. A significant hindrance for applying SPC is that current literature does not provide a process that supports the selection of data that shall be monitored, the gathering, and analysis of the data, and the visualization of the results all in one. In this paper, we provide a process that contains all relevant steps to establish a fully automatic SPC. Our SPC concept is based on Key Performance Indicators (KPIs) for mechatronic systems that statistically measure the product's core functionalities based on its sensor data during product control. By reusing these KPIs. we obtain an efficient process for applying a lightweight SPC. We implement and evaluate our concepts at Diebold Nixdorf (DN) - a leading manufacturer of ATMs.
机译：统计过程控制（SPC）是用于制造机电系统的质量控制仪器，其能够检测制造产品内的微小偏差，以防止严重的质量问题和财务损失。应用SPC的显着障碍是当前文献不提供支持应监视的数据选择，收集和分析数据的数据，以及所有在其中的结果的可视化。在本文中，我们提供了一个包含建立全自动SPC的所有相关步骤的过程。我们的SPC概念基于用于机电系统的关键性能指标（KPI），其在产品控制期间基于其传感器数据统计衡量产品的核心功能。通过重用这些kpis。我们获得了应用轻量级SPC的有效过程。我们在Diebold Nixdorf（DN）实施和评估我们的概念 - ATM的领先制造商。

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