Thin films of poly(N-vinylcarbazole) (PVK) were prepared by spincoating upon fused silica substrates. PVK was dissolved in dimethyl formamide (DMF) and processed at elevated temperatures. Thin films with the required thickness and low surface roughness were obtained by careful optimization of the preparation parameters, such as concentration, spinning speed and temperature of these spincoating process. The dispersion of refractive indices of PVk films was measured by reflectometry and by prism coupling at 633 nm and 1064 nm. The attenuation loss of slab waveguides was measured by monitoring the stray light of the guided mode with a diode array. The loss depends significantly on the relative ratio of surface roughness to thickness. As this ratio depends on preparation conditions, we succeeded in fabricating planar waveguides of PVK that had an attenuation loss of only 1 dB/cm at 633 nm.
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机译：通过在熔融的二氧化硅基材上施加在熔融二氧化硅基质上制备聚（N-乙烯基咔唑）（PVK）的薄膜。将PVK溶于二甲基甲酰胺（DMF）中并在升高的温度下加工。通过仔细优化制备参数，例如浓缩，纺丝工艺的纺丝速度和温度，获得具有所需厚度和低表面粗糙度的薄膜。通过反射测量测量和通过633nm和1064nm的棱镜耦合来测量PVK膜的折射率分散。通过用二极管阵列监测引导模式的杂散光来测量板坯波导的衰减损失。损失显着取决于表面粗糙度与厚度的相对比。随着该比率取决于制备条件，我们成功地制造了PVK的平面波导，其在633nm处仅具有1 dB / cm的衰减损失。
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