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Nanoscale Structure/Property Correlation Through Aberration-Corrected Stem and Theory

机译：纳米级结构/属性通过像差校正的茎和理论相关

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The combination of atomic-resolution Z-contrast microscopy,electron energy loss spectroscopy and first-principles theory has proved to be a powerful means for structure property correlations at interfaces and nanostructures.The scanning transmission electron microscope (STEM) now routinely provides atoic-sized electron beams,allowing simultaneous Z-contrast imaging and EELS as shown in Fig.1.The feasibility of correcting the inherently large spherical aberration of microscope objective lenses promises to at least double the achievable resolution.

机译：原子分辨率Z-对比度显微镜，电子能量损失光谱和第一原理理论的组合已被证明是在界面和纳米结构的结构性相关性的强大方法。扫描透射电子显微镜（Stew）现在经常提供ATOIC尺寸电子束，允许同时Z-对比度成像和鳗鱼，如图1所示。校正显微镜物镜的固有大球形像差的可行性应该至少增加可实现的分辨率。

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《Materials Research Society Symposium》|2003年||共12页
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A.R.Lupini; A.Borisevich; M.F.Chisholm; E.Abe; N.Dellby; O.L.Krivanek; P.D.Nellist; L.G.Wang; R.Buczko; X.Fan; S.T.Pantelides;
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中图分类工程材料学;
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Nanoscale Structure/Property Correlation Through Aberration-Corrected Stem and Theory

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