首页> 外文会议>International conference on advanced diagnostics for magnetic and inertial fusion >The Atomic K- and L-shell Ionization Cross-sections by Electron Impact
【24h】

The Atomic K- and L-shell Ionization Cross-sections by Electron Impact

机译:通过电子撞击原子k-和L-壳电离横截面

获取原文

摘要

The experimental and theoretical study of atomic inner-shell ionization cross-sections by electron impact, a subject of scientific study for many years, is important both for understanding the interaction between electrons and atoms and for technology application. The cross-section for the ionization of atoms and molecules by electron impact is one of the essential sets of data needed in a wide range of applications. For example, this can be used to the impurity diagnosis of magnetic fusion devices. It is well known that radiative cooling by low- and high-Z impurities accounts for a significant fraction of the power loss from tokamak plasmas. Several investigations have shown that the impurity radiation can seriously impair tokamak performance. The study of soft x-rays emitted between l-20keV has, therefore, increased in importance, furnishing electron temperature data and a wealth of impurity information.
机译:电子冲击原子内壳电离横截面的实验和理论研究,科学研究主题多年来,对于了解电子和原子之间的相互作用以及技术应用。通过电子撞击通过电子撞击电离的横截面是各种应用中所需的基本数据集之一。例如,这可以用于磁性融合装置的杂质诊断。众所周知,低Z杂质的辐射冷却占Tokamak等离子体的显着的功率损失。几次调查表明,杂质辐射会严重损害Tokamak性能。因此,在L-20KEV之间发出的软X射线的研究具有重要性,提供电子温度数据和丰富的杂质信息。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号