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首页> 外文会议>International Conference on Synchrotron Radiation Instrumentation >Fast Differential Phase-Contrast Imaging and Total Fluorescence Yield Mapping in a Hard X-ray Fluorescence Microprobe
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Fast Differential Phase-Contrast Imaging and Total Fluorescence Yield Mapping in a Hard X-ray Fluorescence Microprobe

机译：硬X射线荧光微探针中快速差异相位对比度成像和总荧光屈服映射

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摘要

We have incorporated differential phase-contrast (DPC) detection in a hard x-ray fluorescence microprobe at the Advanced Photon Source. We report a straightforward implementation of unidirectional DPC and demonstrate that it is highly advantageous for imaging low-Z specimens with hard x-rays (10keV). Phase-contrast imaging of a specimen can be used to acquire fast overview images of samples that allow more precise targeting of time consuming fluorescence scans. In order to get an overview of the elemental content of a specimen in these fly-scans, we have also implemented a fast detection of total fluorescence yield. Additionally, a DPC image of the specimen is obtained simultaneously with the fluorescence maps in normal step-scanning mode, to facilitate a direct comparison and co-registration with visible light micrographs.
机译：我们在高级光子源处的硬X射线荧光微探针中掺入了差异相位对比度（DPC）检测。我们举报了单向DPC的直接实现，并证明它对于使用硬X射线（10keV）成像低Z样品是非常有利的。样本的相位对比度成像可用于获取允许更精确地瞄准荧光扫描的样本的快速概述图像。为了概述这些飞扫描中标本的元素含量，我们还实施了总荧光产量的快速检测。另外，在正常步进扫描模式下与荧光图同时获得样本的DPC图像，以便于直接比较和与可见光显微照片的共同配准。

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