A UHV Apparatus for Soft X-ray Spectroscopy with Symmetry Selection for Solids and Surfaces

机译：具有对称性和表面的对称选择软X射线光谱的UHV装置

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A UHV apparatus for soft x-ray spectroscopic studies on solids and surfaces has been constructed at the beamline BL27SU in SPring-8. A newly developed flat field spectrometer with a CCD detector is equipped for soft X-ray emission spectroscopy (SXES). The focused beam, less than 10μm in vertical direction, enables us to take entrance slit of the spectrometer away, and to achieve high detection efficiency without loss of incident beam. The energy resolution (E/ΔE) of around 1000 is realized in the energy range of 250–900 eV. An electron energy analyzer is also equipped for photoelectron spectroscopy (PES). An undulator called "Figure-8" at this beamline supplies both horizontally and vertically polarized soft x-rays so that we can get symmetry resolved SXES and PES spectra with ease by changing the polarization.

机译：用于固体和表面的软X射线光谱研究的UHV装置已经在弹簧线BL27SU中构建在弹簧-8中。具有CCD检测器的新开发的平坦场光谱仪用于软X射线发射光谱（SXES）。聚焦光束在垂直方向上小于10μm，使我们能够将光谱仪的入口狭缝放开，并且在不损失入射光束的情况下实现高的检测效率。在250-900eV的能量范围内实现了大约1000个约1000的能量分辨率（E /ΔE）。电子能量分析仪还配备了光电子谱（PES）。在该光束线上称为“图8”的起伏器在水平和垂直偏振的软X射线上提供，使得我们可以通过改变极化来缓解对称解析的SXES和PES光谱。

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《International Conference on Synchrotron Radiation Instrumentation》|2004年||共4页
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Y. Takata; T. Tokushima; Y. Harada; N. Kamakura; Y. Kitajima; M. Nagasono; Y. Tamenori; H. Ohashi; A. Hiraya; E. Ishiguro;
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A UHV Apparatus for Soft X-ray Spectroscopy with Symmetry Selection for Solids and Surfaces

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