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Research on storage life of electronic equipment based on goodness of fit test method

机译:基于拟合试验方法良善的电子设备储存寿命研究

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摘要

The test of distribution is to infer that whether the life of produce can satisfy the distribution chosen by a simple analysis of the test data or the alive using data. Based on the principle of fit goodness test and the Pearson test method, which is one of a common distribution test methods, a kind of special F test method is researched for the situation that the product life obeys to exponential distribution. With that method, the distribution of the storage life of electronic devices is researched.
机译:分配的测试是推断出生产的寿命是否可以满足通过简单分析测试数据或使用数据而选择的分布。基于适合良好测试和Pearson测试方法的原理,这是一种普通分布试验方法之一,研究了产品生活遵循指数分布的情况。利用该方法,研究了电子设备储存寿命的分布。

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