• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>International Conference on Advances in Computing and Information Technology >Analysis on Impact of Behavioral Modeling in Performance of Synthesis Process
【24h】

Analysis on Impact of Behavioral Modeling in Performance of Synthesis Process

机译：行为建模在合成过程性能下的影响分析

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Cell-based design techniques, such as standard-cells and FPGAs, together with versatile hardware synthesis are rudiments for a high productivity in ASIC design. Several monumental changes have occurred in the design structure and execution of electronics principles. In the design process the functionality is defined through Hardware Description Language. The principal feature of a HDL is that it contains the capability to describe the function of hardware independent of implementation. Generally HDL coding styles can have a significant effect on the quality of results and also has the greatest effect on the performance of any event-driven simulator, and is often obvious. Synthesis tools optimize HDL code for both logic utilization and performance of an intended design. This paper focuses how an inefficient coding style can adversely impact synthesis and simulation, resulting in slow circuits, and rectification method to balance between the quality of the end hardware and optimized coding style that boost performance issues. The module functionality are described using Verilog HDL and performance issues like slice utilized, simulation time, percentage of logic utilization, level of logic are analyzed at 90 nm process technology using SPARTAN6 XC6SLX150 XILINX ISE12.1 tool.
机译：基于细胞的设计技术，例如标准电池和FPGA，与多功能硬件合成一起是ASIC设计中高生产率的粗糙度。在设计结构和电子原理执行中发生了几种巨大变化。在设计过程中，功能通过硬件描述语言定义。 HDL的主要功能是它包含描述硬件独立于实现的功能的功能。通常，HDL编码风格可能对结果的质量产生显着影响，并且对任何事件驱动的模拟器的性能也具有最大的影响，并且通常是显而易见的。综合工具优化HDL码以实现逻辑利用率和预期设计的性能。本文重点介绍了效率低下的编码风格可能会对合成和仿真产生不利影响，导致慢速电路，并在最终硬件质量与促进性能问题的优化编码风格之间平衡的整流方法。使用Verilog HDL和逻辑利用率，逻辑利用率的百分比，在90nm工艺技术中使用Verilog HDL和逻辑利用率的百分比来描述模块功能，使用Spartan6 XC6SLX150 Xilinx ISE12.1工具分析逻辑水平。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号