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Modelling electronic circuit failures using a Xilinx FPGA system

机译:使用Xilinx FPGA系统建模电子电路故障

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FPGAs are a ubiquitous electronic component utilised in a wide range of electronic systems across many industries. Almost all modern FPGAs employ SRAM based configuration memory elements which are susceptible to radiation induced soft errors. In high altitude and space applications, as well as in the nuclear and defence industries, such circuits must operate reliably in radiation-rich environments. A range of soft error mitigation techniques have been proposed but testing and qualification of new fault tolerant circuits can be an expensive and time consuming process. A novel method for simulating radiation-induced soft errors is presented that operates entirely within a laboratory environment and requires no hazardous exposure to radiation or expensive airborne test rigs. A system utilising modular redundancy is then implemented and tested under the new method. The test system is further demonstrated in conjunction with a software flight simulator to test single electronic modules in the context of active service on board a passenger aircraft and the effects of failure under radiation induced soft errors are observed. Our research proposes a test regime in which design strategies for self-healing circuits can be compared and demonstrated to work.
机译:FPGA是一种普遍存在的电子元件,用于许多行业的各种电子系统。几乎所有现代FPGA都使用基于SRAM的配置内存元件,该元素易受辐射引起的软误差。在高海拔和空间应用中,以及核和国防行业,这种电路必须可靠地在富裕的环境中运行。已经提出了一系列软误差缓解技术,但新的容错电路的测试和资格可以是昂贵且耗时的过程。介绍了一种模拟辐射诱导的软误差的新方法,其完全在实验室环境内工作,并且不需要对辐射或昂贵的空中试验台没有危险的暴露。然后在新方法下实现和测试利用模块化冗余的系统。进一步与软件飞行模拟器进一步说明测试系统,以测试单个电子模块在乘用车的主动服务的背景下,观察到辐射引起的辐射诱导的软误差下的失效效果。我们的研究提出了一种测试制度,可以比较自我修复电路的设计策略和证明工作。

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