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首页> 外文会议>Physics of Medical Imaging >Increased count-rate performance and dose efficiency for silicon photon-counting detectors for full-field CT using an ASIC with adjustable shaping time
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Increased count-rate performance and dose efficiency for silicon photon-counting detectors for full-field CT using an ASIC with adjustable shaping time

机译：使用ASIC具有可调节成形时间的全场CT的硅光子计数探测器的计数率性能和剂量效率增加

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摘要

Photon-counting silicon strip detectors are attracting interest for use in next generation CT scanners. For silicon detectors, a low noise floor is necessary to obtain a good dose efficiency. A low noise floor can be achieved by having a filter with a long shaping time in the readout electronics. This also increases the pulse length, resulting in a long deadtime and thereby a degraded count-rate performance. However, as the flux typically varies greatly during a CT scan, a high count-rate capability is not required for all projection lines. It would therefore be desirable to use more than one shaping time within a single scan. To evaluate the potential benefit of using more than one shaping time, it is of interest to characterize the relation between the shaping time, the noise, and the resulting pulse shape. In this work we present noise and pulse shape measurements on a photon-counting detector with two different shaping times along with a complementary simulation model of the readout electronics. We show that increasing the shaping time from 28.1 ns to 39.4 ns decreases the noise and increases the signal-to-noise ratio (SNR) with 6.5% at low count rates and we also present pulse shapes for each shaping time as measured at a synchrotron source. Our results demonstrate that the shaping time plays an important role in optimizing the dose efficiency in a photon-counting x-ray detector.
机译：计数光子计数硅条探测器吸引了在下一代CT扫描仪中使用的兴趣。对于硅探测器，低噪声底层是获得良好剂量效率的必要条件。通过在读出电子器件中具有具有长成形时间的过滤器，可以实现低噪声地板。这也增加了脉冲长度，导致长时间长时间，从而降低的计数性能。然而，由于通量在CT扫描期间通常在很大程度上变化，因此所有投影线都不需要高计数率能力。因此，希望在单个扫描内使用多于一个成形时间。为了评估使用多于一个成形时间的潜在益处，表征成形时间，噪声和所得脉冲形状之间的关系感兴趣。在这项工作中，我们对光子计数检测器上的噪声和脉冲形状测量，具有两个不同的成形时间以及读出电子设备的互补模拟模型。我们表明，从28.1ns到39.4 ns增加成形时间降低了噪声，并在低计数速率下增加了6.5％的信噪比（SNR），我们还在同步rotron测量的每个成形时间呈现脉冲形状来源。我们的结果表明，成形时间在优化光子计数X射线检测器中的剂量效率方面发挥着重要作用。

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