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首页> 外文会议>International Seminar on Applied Physics, Optoelectronics and Photonics >Impact of Standard Deviation and Reflectance of the Measured Surface on Laser Diode- Position Sensitive Detector System
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Impact of Standard Deviation and Reflectance of the Measured Surface on Laser Diode- Position Sensitive Detector System

机译：测量表面对激光二极管位置敏感探测器系统的标准偏差和反射率的影响

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For improving the accuracy and applicability of laser diode- position sensitive detector (LD-PSD) system, a model of roughness and reflectance of the measured surface is established. Combining this model with the light intensity response model of PSD and the space radiation model, we derived the relationship between the standard deviation (a), reflectance (p) and the center-of-gravity of light intensity (X_0). This relationship shows that X_0 is disturbed by a or p only if a or p changes within the spot. We conducted a simulation and experiment to test this relationship. The results showed a good consistency with the theory, which proved that the variation of a and p can greatly impact the accuracy and robustness of LD-PSD system, and a smaller light spot can improve this situation.
机译：为了提高激光二极管位置敏感检测器（LD-PSD）系统的精度和适用性，建立了测量表面的粗糙度和反射率的模型。将该模型与PSD和空间辐射模型的光强度响应模型相结合，我们从光强度（X_0）的标准偏差（A），反射（P）和重心之间的关系。这种关系表明，X_0才受到A或P时的扰乱，只有在点内的A或P更改时。我们进行了模拟和实验以测试这种关系。结果表明，该理论呈现出良好的一致性，证明A和P的变化可以大大影响LD-PSD系统的准确性和稳健性，并且较小的光点可以改善这种情况。

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