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An Efficient Approach to Find the Truncation Frequency for Transmission Line-Based Dielectric Material Property Extraction

机译:基于传输线的电介质材料特性提取的有效方法来找到截断频率

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Material properties of dielectric substrates play an important role in high-speed printed circuit board (PCB) design. The Transmission Line-Based material property extraction method is an effective way to obtain substrate properties. However, the method requires transmission line dominated S-parameter data. Even with de-embedding, S-parameters may include non-transmission line effects. Thus, to obtain correct material properties, it is necessary to truncate the S-parameter data at a frequency before non-transmission line effects begin to dominate. In this paper, a novel binary fitting-based method is proposed to find the truncation frequency accurately and efficiently. By using a binary search algorithm and physics-based fitting method, the proposed method is able to find the truncation frequency in only a few iterations. This method has been validated for hundreds of real measurement cases and has shown good adaptability and rationality.
机译:介电基板的材料特性在高速印刷电路板(PCB)设计中起重要作用。基于传输线的材料特性提取方法是获得基材性质的有效方法。但是,该方法需要传输线主导的S参数数据。即使使用去嵌入,S参数也可以包括非传输线效应。因此,为了获得正确的材料特性,必须在非传输线效应开始主导之前以频率截断S参数数据。本文提出了一种新型二元拟合方法,以准确且有效地找到截断频率。通过使用二进制搜索算法和基于物理的拟合方法,所提出的方法能够仅在几个迭代中找到截断频率。此方法已被验证为数百个实际测量情况,并显示出良好的适应性和合理性。

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