• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>International Conference on Speckle Metrology >Full-sensitivity depth-resolved measurements of displacement fields inside weakly scattering materials using wavelength scanning interferometry
【24h】

Full-sensitivity depth-resolved measurements of displacement fields inside weakly scattering materials using wavelength scanning interferometry

机译：利用波长扫描干涉测量，使用波长散射材料内部位移场的全感应性深度分辨测量

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

This paper extends Digital Speckle Pattern Interferometry into three dimensions. A Wavelength Scanning Interferometry (WSI) system is proposed which provides displacement fields inside the volume of semi-transparent scattering materials with high spatial resolution and three-dimensional displacement sensitivity. The main driver to develop such a system is the need to determine constitutive parameters (mainly elastic constants) of materials such as polymers and biological tissues so that their behavior can be modeled computationally. The sample is illuminated by three non-coplanar collimated beams around the observation direction. Sequences of two-dimensional interferograms are recorded while the frequency of the laser is tuned at a constant rate. Each pixel thus records and intensity signal which temporal frequency encodes the optical path difference between the illumination and reference beams for a particular point on the sample. Fourier transformation along the time axis reconstructs the magnitude and phase of the material's microstructure. Different optical paths along each illumination direction are required in order to separate or multiplex, in the frequency domain, the signals corresponding to each sensitivity vector. In this way, all the information required to reconstruct the location and the 3D displacement vector of scattering points within the volume in the material is recorded simultaneously. A controlled validation experiment is performed, which confirms the ability of the technique to provide three dimensional displacement distributions inside semitransparent scattering materials.
机译：本文将数字散斑模式干涉测量仪扩展为三维。提出了一种波长扫描干涉机（WSI）系统，其在具有高空间分辨率和三维位移灵敏度的半透明散射材料的体积内提供位移场。开发这种系统的主要驱动器是需要确定诸如聚合物和生物组织的材料的组成型参数（主要是弹性常数），从而可以计算它们的行为。将样品通过围绕观察方向的三个非共面准直光束照射。记录二维干涉图的序列，同时以恒定速率调谐激光的频率。因此，每个像素的记录和强度信号是哪个时间频率对样品上的特定点的照明和参考光束之间的光路径进行编码。沿着时间轴的傅里叶变换重建了材料的微观结构的幅度和相位。需要沿着每个照明方向的不同光路，以便在频域中分离或多路复用与每个灵敏度向量相对应的信号。以这种方式，同时记录重建材料内的体积内的散射点的位置和3D位移矢量所需的所有信息。进行受控验证实验，这证实了该技术在半透明散射材料内提供三维位移分布的能力。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号