Design and Test of MEMS Attitude Measurement Unit for Fall Detection

著录项

• 来源
  《International Conference of Chinese Society of Micro-Nano Technology;Annual Conference of the Chinese Society of Micro-Nano Technology》|2010年|p.465-470|共6页
• 会议地点 Xian(CN);Xian(CN)
• 作者

  Xiaoyan Liu; Zhaoying Zhou; Wei Xiong;

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• 作者单位

  State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084, China;

  State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084, China;

  State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084, China;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 光学仪器;微电子学、集成电路（IC）;
• 关键词

  fall detection; MEMS attitude measurement unit; error test;

  机译：跌倒检测MEMS姿态测量单元；错误测试;