Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

机译：样品旋转：一种补偿颗粒电子探针微分析过程中不规则样品几何形状的机械方法

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来源
《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|608-609|共2页
会议地点 Nashville TN(US)
作者
C.S. Schwandt;
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McCrone Associates, Inc., 850 Pasquinelli Drive, Westmont, IL 60559;

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原文格式 PDF
正文语种 eng
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Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

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