Submicron-Resolution 3D X-Ray Microscopy for the Investigation of Deformation on Mesoscopic Length Scales

著录项

• 来源
  《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|734-735|共2页
• 会议地点 Phoenix AZ(US)
• 作者

  B. C. Larson; J. Z. Tischler; Y. Gao;

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• 作者单位

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge,rnTN 37831, USA;

  Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60496, USA;

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge,rnTN 37831, USA Materials Science and Engineering Department, University of Tennessee, Knoxville,rnTN 37996, USA;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词