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EBIC studies of heterojunction bipolar transistors

机译:异质结双极晶体管的EBIC研究

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Measurements on GaAs homo- and heterojunction bipolar transistors followed the approach of Gonzales (1974) who considered the interaction of the two junctions in analysing such devices.The electron beam induced voltage produced across a charge collecting barrier without an electrical contact could be detected by a neighbouring junction.This can be useful for examining regions of integrated circuits to which no direct contact is made.Observations on the two forms of GaAs transistors are presented and discussed.
机译:GaAs同质和异质结双极晶体管的测量遵循Gonzales(1974)的方法,他在分析此类器件时考虑了两个结的相互作用。这对于检查没有直接接触的集成电路区域很有用。本文介绍并讨论了两种形式的GaAs晶体管的观察。

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