An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneity at the first time. Also the concise Transverse Transmission Line -TTL full wave method is used, in the analysis. New resutls of the complex propagation and of the characteristic impedance as function of the frequency and differnet dimensions and conductivity of the substrate, are obtained in 3-D.
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