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首页> 外文会议>Modeling aspects in optical metrology V >Simulation of light in-coupling through an aperture probe to investigate light propagation in a thin layer for opto-electronic application
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Simulation of light in-coupling through an aperture probe to investigate light propagation in a thin layer for opto-electronic application

机译：通过光圈探针模拟光耦合，以研究光在光电应用中在薄层中的传播

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摘要

In thin optoelectronic devices, like organic light emitting diodes (OLED) or thin-film solar cells (TFSC), light propagation, which is initiated by a local point source, is of particular importance. In OLEDs, light is generated in the layer by the luminescence of single molecules, whereas in TFSCs, light is coupled into the devices by scattering at small surface features. In both applications, light propagation within the active layers has a significant impact on the optical device performance. Scanning near-field optical microscopy (SNOM) using aperture probes is a powerful tool to investigate this propagation with a high spatial resolution. Dual-probe SNOM allows simulating the local light generation by an illumination probe as well as the detection of the light propagated through the layer. In our work, we focus on the light propagation in thin silicon films as used in thin-film silicon solar cells. We investigate the light-in-coupling from an illuminating probe via rigorous solution of Maxwell's equations using a Finite-Difference Time-Domain approach, especially to gain insight into the light distribution inside a thin layer, which is not accessible in the experiment. The structures investigated include fiat and structured surfaces with varying illumination positions and wavelengths. From the performed simulations, we define a "spatial sensitivity" which is characteristic for the local structure and illumination position. This quantity can help to identify structures which are beneficial as well as detrimental to absorption inside the investigated layer. We find a strong dependence of the spatial sensitivity on the surface structure as well as both the absorption coefficient and the probe position. Furthermore, we investigate inhomogeneity in local light propagation resulting from different surface structures and illumination positions.
机译：在诸如有机发光二极管（OLED）或薄膜太阳能电池（TFSC）之类的薄光电器件中，由局部点源引发的光传播特别重要。在OLED中，光是通过单个分子的发光在层中生成的，而在TFSC中，光是通过在较小的表面特征处散射而耦合到器件中的。在两种应用中，光在有源层中的传播都会对光学器件的性能产生重大影响。使用孔径探针扫描近场光学显微镜（SNOM）是一种强大的工具，可以以高空间分辨率研究这种传播。双探头SNOM可以模拟照明探针产生的局部光以及检测穿过该层传播的光。在我们的工作中，我们专注于薄膜硅太阳能电池中使用的薄膜中的光传播。我们使用有限差分时域方法通过麦克斯韦方程组的严格解来研究照明探针的光耦合，特别是获得对薄层内部光分布的洞察力，这在实验中是无法访问的。研究的结构包括具有变化的照明位置和波长的平坦表面和结构化表面。从执行的模拟中，我们定义了“空间灵敏度”，这是局部结构和照明位置的特征。该量可以帮助确定有利于并且不利于被调查层内部吸收的结构。我们发现空间灵敏度对表面结构以及吸收系数和探头位置都有很强的依赖性。此外，我们研究了由不同表面结构和照明位置导致的局部光传播的不均匀性。

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  • 来源
    《Modeling aspects in optical metrology V》|2015年|95260W.1-95260W.9|共9页
  • 会议地点 Munich(DE)
  • 作者

    Markus Ermes; Stephan Lehnen; Zhao Cao; Karsten Bittkau; Reinhard Carius;

  • 作者单位

    IEK5 - Photovoltaics, Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Str., Juelich, Germany;

    IEK5 - Photovoltaics, Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Str., Juelich, Germany;

    IEK5 - Photovoltaics, Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Str., Juelich, Germany;

    IEK5 - Photovoltaics, Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Str., Juelich, Germany;

    IEK5 - Photovoltaics, Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Str., Juelich, Germany;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    SNOM; NSOM; optical simulation; fdtd; topography artefacts;

    机译：SNOM; NSOM；光学模拟fdtd;地形文物;

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