首页> 外文会议>Nanotechnology Materials and Devices Conference, 2006 IEEE >Enhancement of PL intensity by photonic crystal fabricated on GaAs substrate using nanoporous alumina mask
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Enhancement of PL intensity by photonic crystal fabricated on GaAs substrate using nanoporous alumina mask

机译:使用纳米多孔氧化铝掩模在GaAs衬底上制造的光子晶体增强PL强度

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We fabricated photonic crystal structure on GaAs substrate using nanoporous alumina mask. Uniform arrays of nano-sized pores produced in anodic alumina were transferred into GaAs substrate by inductively coupled plasma reactive ion etching (ICP-RIE). The photonic crystal structure, the nanohole array with uniform diameter of 60 nm and interpore distance of 105 nm, was formed on GaAs substrate as replica of the alumina mask. Its photoluminescence (PL) showed enhanced intensity compared with that from GaAs substrate without its structure. The ICP-RIE technique using nanoporous alumina mask can be used as a prospective method in the fabrication of nano-devices for nanotechnology.
机译:我们使用纳米多孔氧化铝掩模在GaAs衬底上制造了光子晶体结构。通过感应耦合等离子体反应离子刻蚀(ICP-RIE),将阳极氧化铝中产生的纳米孔的均匀阵列转移到GaAs衬底中。在作为氧化铝掩模的复制品的GaAs衬底上形成了光子晶体结构,即具有60nm的均匀直径和105nm的孔间距离的纳米孔阵列。与没有结构的GaAs基板相比,其光致发光(PL)强度有所提高。使用纳米多孔氧化铝掩模的ICP-RIE技术可以用作制备用于纳米技术的纳米器件的预期方法。

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