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首页> 外文会议>NATO Advanced Study Institute on Magnetic Storage Systems Beyond 2000, Jun 25-Jul 7, 2000, Rhodes, Greece >EFFICIENT KERR MICROSCOPY
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EFFICIENT KERR MICROSCOPY

机译：高效的KERR显微镜

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摘要

The performance of magnetic devices correlates with the spatial distribution and time evolution of the magnetization. In recording heads for example, the magnetization components M_x(t), M_y(t), and M_z(t) are very sensitive to the device boundaries, defects, issues of design and processing, and an applied or internal magnetic field or magnetomotive force. With the increasing difficulty of reliably modeling complex magnetic devices ever decreasing in size, efficient experimental Kerr-effect contrast imaging of M-components becomes more important as aid to progress in fundamental understanding, diagnostics and development. This paper discloses innovations which enable imaging of pure in-plane magnetization sensitive Kerr components devoid of polar Kerr and background signals. For the component sensitive to perpendicular magnetization, a means for calibrating pure polar Kerr contrast relative to the pure in-plane contrast is described. These methods operate without the reliance on changing magnetic state for background subtraction as in earlier methods. They are therefore applicable to imaging the three M-components at different stages of magnetization in recording heads, and in magnetically 'hard' materials, for example amorphous magnets and media for perpendicular magnetic recording.
机译：磁性设备的性能与磁化的空间分布和时间演变相关。例如在记录头中，磁化分量M_x（t），M_y（t）和M_z（t）对设备边界，缺陷，设计和加工问题以及施加的或内部的磁场或磁通势非常敏感。随着对复杂磁性设备进行可靠建模的难度不断减小，对M分量进行有效的实验性Kerr效应对比成像变得越来越重要，因为它有助于基础理解，诊断和开发的进步。本文介绍了一些创新技术，这些技术可实现对纯平面内磁化敏感的Kerr分量成像，而无需极性Kerr和背景信号。对于对垂直磁化敏感的组件，描述了一种相对于纯平面内对比度校准纯极性克尔对比度的装置。这些方法的运行不像以前的方法那样依靠改变磁态来进行背景扣除。因此，它们适用于在记录头和磁性“硬”材料（例如非晶形磁体和用于垂直磁记录的介质）中磁化不同阶段的三个M分量成像。

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