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Effects of dislocations and sub-grain boundaries on X-ray response maps of CdZnTe radiation detectors

机译:位错和亚晶界对CdZnTe辐射探测器X射线响应图的影响

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The imperfect quality of CdZnTe (CZT) crystals for radiation detectors seriously diminishes their suitability for different applications. Dislocations and other dislocationrelated defects, such as sub-grain boundaries and dislocation fields around Te inclusions, engender significant charge losses and, consequently, cause fluctuations in the detector's output signals, thereby hindering their spectroscopic responses. In this paper, we discuss our results from characterizing CZT material by using a high-spatial-resolution X-ray response mapping system at BNL's National Synchrotron Light Source. In this paper, we emphasize the roles of these dislocation-related defects and their contributions in degrading the detector's performance. Specifically, we compare the effects of the subgrain- and coherent twin-boundaries on the X-ray response maps.
机译:用于辐射探测器的CdZnTe(CZT)晶体的不完美质量严重降低了它们在不同应用中的适用性。位错和其他与位错相关的缺陷(例如亚晶粒边界和Te夹杂物周围的位错场)会产生大量电荷损失,并因此导致检测器输出信号的波动,从而阻碍其光谱响应。在本文中,我们将讨论在BNL国家同步加速器光源上使用高空间分辨率X射线响应映射系统表征CZT材料的结果。在本文中,我们强调了这些与位错有关的缺陷的作用及其在降低检测器性能方面的作用。具体来说,我们比较了X射线反应图上亚晶粒和相干孪晶边界的影响。

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