Metrology of IXO Mirror Segments

著录项

• 来源
  《Optics for EUV, x-ray, and gamma-ray astronomy V》|2011年|p.814716.1-814716.12|共12页
• 会议地点 San Diego CA(US)
• 作者

  Kai-Wing Chan; Melinda Hong; Timo Saha; William Zhang;

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• 作者单位

  Center for Research and Exploration in Space Science and Technology Center for Space Science and Technology, University of Maryland, Baltimore County, Baltimore MD 21250, USA,X-Ray Astrophysics Laboratory, NASA/Goddard Space Flight Center, Greenbelt, MD 20771, USA;

  SGT, Inc., 7701 Greenbelt Road, Greenbelt, MD 20770, USA;

  Optics Branch, NASA/Goddard Space Flight Center, Greenbelt, MD 20771, USA;

  X-Ray Astrophysics Laboratory, NASA/Goddard Space Flight Center, Greenbelt, MD 20771, USA;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 航空仪表、航空设备;X射线、紫外线、红外线;
• 关键词

  X-ray optics; lightweight mirror; metrology; normal incidence metrology;

  机译：X射线光学；轻便的镜子；计量法向入射计量;