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Approach to a Machine-Integrated Measurement Device for the Interferometric Testing of Ultraprecise Surfaces

机译:一种用于超精密表面干涉测量的机器集成测量设备的方法

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In-situ measurements of surface characteristics can deliver very helpful informations for the process control, so that process parameters can be adjusted directly during the fabrication process. The requirements are dependent on the field of application. For the applications of ultra precise surfaces, e.g. micro structured or continuous optical components, interferometric form testing may be suited, because of its very high accuracy and flexibility. Furthermore with interferometry the surfaces can be measured very fast, which leads to a reduced production time. However, a disadvantage may be the sensitivity of interferometric systems to external influences, like machine vibrations, noise or air turbulences. Due to this reason, it is very difficult to perform interferometric measurements within a production environment. In this paper we present interferometric measurements in the manufacturing machine environment and simulation based results of the analysis of fundamental influences on interferometers operated in-situ.
机译:表面特性的原位测量可以为过程控制提供非常有用的信息,以便可以在制造过程中直接调整过程参数。要求取决于应用领域。对于超精密表面的应用,例如由于是微结构或连续光学组件,因此干涉式测试非常适合,因为它具有很高的准确性和灵活性。此外,利用干涉测量法可以非常快速地测量表面,从而缩短了生产时间。但是,缺点可能是干涉仪系统对外部影响(如机器振动,噪声或空气湍流)的敏感性。由于这个原因,在生产环境中执行干涉测量非常困难。在本文中,我们介绍了在制造机器环境中进行的干涉测量和基于对对就地操作的干涉仪的基本影响进行分析的模拟结果。

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