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首页> 外文会议>Physics, simulation, and photonic engineering of photovoltaic devices II >GaN Microdomes for Broadband Omnidirectional Antireflection for Concentrator Photovoltaics
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GaN Microdomes for Broadband Omnidirectional Antireflection for Concentrator Photovoltaics

机译：用于聚光器光伏宽带全向减反射的GaN微球

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摘要

GaN microdomes are studied as a broadband omnidirectional anti-reflection structure for high efficiency multi-junction concentrated photovoltaics. Comprehensive studies of the effect of GaN microdome sizes and shapes on the light collection efficiency were studied. The three dimensional finite difference time domain (3-D FDTD) method was used to calculate the surface reflectance of GaN microdomes as compared to that of the flat surface. Studies indicate significant reduction of the surface reflectance is achievable by properly designing the microdome structures. Formation of the GaN microdomes with the flexibility to tune the size and shape has been demonstrated by using reactive ion etching (RIE) of both GaN and the self-assembled silica monolayer microspheres. Characterizations of the angle-dependence light surface reflectance for both micro-domes and flat surface show the similar trend as the simulation.
机译：GaN微球被研究为一种用于高效多结聚光光伏的宽带全向抗反射结构。全面研究了GaN微球的大小和形状对光收集效率的影响。与平面相比，使用三维有限差分时域（3-D FDTD）方法计算GaN微球的表面反射率。研究表明，通过适当设计微球罩结构可以显着降低表面反射率。通过使用GaN和自组装二氧化硅单层微球体的反应离子刻蚀（RIE），已经证明了具有微调尺寸和形状灵活性的GaN微球的形成。微穹顶和平坦表面的角度相关光表面反射率的表征显示出与模拟相似的趋势。

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  • 会议地点 San Francisco CA(US)
  • 作者

    Lu Han; Matthew R. McGoogan; Tyler A. Piedimonte; Ian V. Kidd; Roger H. French; Hongping Zhao;

  • 作者单位

    Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH 44106, USA;

    Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH 44106, USA;

    Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH 44106, USA;

    Department of Material Science and Engineering, Case Western Reserve University, Cleveland, OH 44106, USA;

    Department of Material Science and Engineering, Case Western Reserve University, Cleveland, OH 44106, USA;

    Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH 44106, USA;

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