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Understanding variability in MgO-based ReRAM devices for trust in semiconductor designs

机译:了解基于MgO的ReRAM器件的可变性以信任半导体设计

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摘要

This paper discusses the characteristics and fabrication processes involved in novel MgO-Si based forming-free and self-compliant current controlled Resistive Random Access Memory (ReRAM) devices. Experimental data was taken from several devices and used to generate a model to simulate device switching characteristics. The unique characteristics of these devices are utilized to demonstrate an application in hardware security. The application is then validated through a series of simulations of the circuit design.
机译:本文讨论了基于新颖的基于MgO-Si的无成形和自适应电流控制的电阻型随机存取存储器(ReRAM)器件的特性和制造工艺。实验数据来自数个设备,并用于生成模型以仿真设备开关特性。这些设备的独特特性可用于演示硬件安全性中的应用。然后,通过一系列电路设计仿真来验证该应用。

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