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Temperature Dependence(300-600K) Of Parasitic Bipolar Effects in SOI-MOSFETs

机译:SOI-MOSFET中寄生双极性效应的温度依赖性(300-600K)

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摘要

The temperature dependence of parasitic bipolar effects in SOI-MOSFETs is investigated as a function of drain bias. A simple extraction technique for the bipolar current gain #beta# is presented. Based on experimental results, it is shown that the parasitic bipolar transistor ofthe SOI-MOS structure behaves as an ordinary bipolar device. #beta# increases with temperature causing premature breakdown and latch at elevated temperatures. The main mechanisms involved in the device latch are outlined.
机译:研究了SOI-MOSFET中寄生双极效应对温度的依赖关系,它是漏极偏置的函数。提出了一种用于双极电流增益#beta#的简单提取技术。根据实验结果表明,SOI-MOS结构的寄生双极型晶体管的行为与普通的双极型器件相同。 #beta#随着温度增加而引起过早击穿,并在高温下锁存。概述了设备锁存器中涉及的主要机制。

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