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Architectural assessment of design techniques to improve speed and robustness in embedded microprocessors

机译:设计技术的体系结构评估,以提高嵌入式微处理器的速度和鲁棒性

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This work investigates the interrelation of performance and robustness against variability in industrial microprocessor designs. A novel analysis technique for variation-sensitive hardware and two figures of merit to quantify the robustness of a design against variations are proposed. Together with a multi-stage STA this enables an efficient application of low-VT cell insertion and pulsed latch design to compensate for within-die delay variations. For the same speed margin of 5% on design level, a pulsed latch design of an ARM926 microprocessor shows a 2.5x higher robustness compared to a MS-FF design with selective low-VT cell insertion.
机译:这项工作研究了性能和鲁棒性与工业微处理器设计中可变性之间的相互关系。提出了一种对变化敏感的硬件的新颖分析技术,以及两个能量化设计抗变化鲁棒性的品质因数。与多级STA一起使用,可以有效地应用低VT单元插入和脉冲锁存器设计,以补偿芯片内延迟变化。对于设计水平上5%的相同速度裕度,与具有选择性低VT单元插入的MS-FF设计相比,ARM926微处理器的脉冲锁存器设计具有高出2.5倍的鲁棒性。

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