Optical material characterization through BSDF measurement andanalysis

著录项

• 来源
  《Reflection, scattering, and diffraction from surfaces II》|2010年|p.779211.1-779211.11|共11页
• 会议地点 San Diego CA(US)
• 作者

  Andrea M. Brown; Daniel V. Hahn; Michael E. Thomas; David M. Brown; Jessica Makowski;

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• 作者单位

  Johns Hopkins University Applied Physics Laboratory, 11100 Johns Hopkins Rd, Laurel, MD,rnUSA 20723;

  Johns Hopkins University Applied Physics Laboratory, 11100 Johns Hopkins Rd, Laurel, MD,rnUSA 20723;

  Johns Hopkins University Applied Physics Laboratory, 11100 Johns Hopkins Rd, Laurel, MD,rnUSA 20723;

  Johns Hopkins University Applied Physics Laboratory, 11100 Johns Hopkins Rd, Laurel, MD,rnUSA 20723;

  Johns Hopkins University Applied Physics Laboratory, 11100 Johns Hopkins Rd, Laurel, MD,rnUSA 20723;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 光学;
• 关键词

  surface scattering; BRDF; BSDF;

  机译：表面散射BRDF；自卫队;