首页> 外文会议>Simulation of semiconductor processes and devices 1998(SISPAD98) >3D-Simulation of an Enhanced Field-Funneling Effect on the Collection of Alpha-Particle-Generated Carriers in P~- on P~+ Epitaxial Substrates
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3D-Simulation of an Enhanced Field-Funneling Effect on the Collection of Alpha-Particle-Generated Carriers in P~- on P~+ Epitaxial Substrates

机译:对P〜+外延衬底上P〜-中的α-粒子产生的载流子收集增强场漏效应的3D模拟

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摘要

We have investigated the soft-error phenomena in p~- on p~+ epitaxial substrates using three dimensional device simulator. We demonstrate for the first time that the field-funneling on the collection of alpha-particle-generated carriers in a memory cell is enhanced in a p~- on p~+ epitaxial substrate in comparison with that in a p~--type Czochralski substrate. In addition, we have found the reason why the epitaxial-layer thickness dependence of the charge-collection in a memory cell is opposite to that in a TEG (Test Element Group) structure having a large charge-collection area.
机译:我们使用三维器件仿真器研究了p〜+外延衬底上p〜-上的软错误现象。我们首次证明,与p-型切克劳斯基基片相比,p-上的p- +外延基片增强了存储单元中由α-颗粒产生的载流子集合上的场漏。另外,我们发现了为什么存储单元中电荷收集的外延层厚度依赖性与具有大电荷收集面积的TEG(测试元件组)结构中的外延层厚度依赖性相反的原因。

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  • 会议地点 Leuven(BE);Leuven(BE)
  • 作者单位

    ULSI Development Center, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami, Hyogo 664-8641, Japan;

    ULSI Development Center, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami, Hyogo 664-8641, Japan;

    ULSI Development Center, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami, Hyogo 664-8641, Japan;

    ULSI Development Center, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami, Hyogo 664-8641, Japan;

    ULSI Development Center, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami, Hyogo 664-8641, Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 半导体器件制造工艺及设备;
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