Quantitative high resolution electron microscopy of grain boundaries

机译：晶界的定量高分辨率电子显微镜

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The >= 11 (113)/[110] symmetric tilt grain boundary has been characterized by high resolution transmission electron microscopy. The method by which the images are prepared for analysis is described. The statistics of the image data have been found to follow a normal distribution. The electron-optical imaging parameters used to acquire the image have been determined by non-linear least-square image simulation optimization within the perfect crystal region of the micrograph. A similar image simulation optimization procedure is used to determine the atom positions which provide the best match between the experimental image and the image simulation.

机译：> = 11（113）/ [110]对称倾斜晶界已通过高分辨率透射电子显微镜表征。描述了准备图像进行分析的方法。已经发现图像数据的统计遵循正态分布。在显微照片的理想晶体区域内，通过非线性最小二乘图像模拟优化确定了用于获取图像的电子光学成像参数。使用类似的图像模拟优化程序来确定原子位置，该原子位置可在实验图像和图像模拟之间提供最佳匹配。

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《Symposium on Atomic Resolution Microscopy of Surfaces and Interfaces held December 3-5, 1996, Boston; Massachusetts,U.S.A.》|1996年|p.119-124|共6页
会议地点 Boston MA(US)
作者
Geoffrey H.Campbell; Wayne E.King; Dov Cohen; C.Barry Carter;
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正文语种 eng
中图分类一般工业技术;
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1. High-resolution transmission electron microscopy and computational analyses of atomic structures of [0001] symmetric tilt grain boundaries of Al_2O_3 with equivalent grain-boundary planes [J] . K. Matsunaga, H. Nishimura, T. Saito, Philosophical magazine: structure and properties of condensed matter . 2003,第36期

机译：具有等效晶界面的Al_2O_3 [0001]对称倾斜晶界的原子结构的高分辨率透射电子显微镜和原子分析
2. High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites [J] . Knowles KM., Turan S. Crystal Research and Technology: Journal of Experimental and Industrial Crystallography . 2000,第6a7期

机译：Si3N4-SiC颗粒复合物中六方氮化硼晶粒之间晶界的高分辨率透射电子显微镜
3. High-resolution electron microscopy of grain boundaries in Ni-3(Al0.8Ti0.2) bicrystals .2. Coincidence site lattice boundaries [J] . Takasugi T, Emori H, Hiraga K Philosophical Magazine, A. Physics of condensed matter, defects and mechanical properties . 1997,第5期

机译：Ni-3（Al0.8Ti0.2）双晶中晶界的高分辨率电子显微镜2。重合点晶格边界
4. Quantitative high resolution electron microscopy of grain boundaries [C] . Geoffrey H.Campbell, Wayne E.King, Dov Cohen, Symposium on atomic resolution microscopy of surfaces and interfaces . 1997

机译：晶界的定量高分辨率电子显微镜
5. Quantitative measurement and analysis of grain boundary sliding in ultrafine-grained 5083 Aluminum by atomic force microscopy. [D] . Han, Jung Hun. 2010

机译：原子力显微镜对5083超细晶粒铝晶界滑动的定量测量与分析。
6. Correlation between Al grain size grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy [O] . Samira Nik, Philip Krantz, Lunjie Zeng, -1

机译：透射电子显微镜观察Al晶粒尺寸晶界沟槽与Al / AlOx / Al隧道结氧化物势垒厚度局部变化的相关性
7. Analysis of Stresses and Strains around Dislocations at Grain Boundaries by Quantitative High-Resolution Electron Microscopy [O] . M Hytch, J-L Putaux, J Thibault 2006

机译：用定量高分辨率电子显微镜分析晶界位错的应力和菌株
8. Quantitative high resolution electron microscopy of grain boundaries [R] . Campbell, G. H. 1996

机译：晶界的定量高分辨率电子显微镜

Quantitative high resolution electron microscopy of grain boundaries

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