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首页> 外文会议>Symposium on Atomic Resolution Microscopy of Surfaces and Interfaces held December 3-5, 1996, Boston; Massachusetts,U.S.A. >Detemination of the three-dimensional atomic structure at internal interfaces by electron energy loss spectroscopy
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Detemination of the three-dimensional atomic structure at internal interfaces by electron energy loss spectroscopy

机译：用电子能量损失光谱法测定内部界面的三维原子结构

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摘要

The fine structure of a core-loss edge contains detailed information on the local atomic environment. It can be used as an extremely sensitive probe of the fluctuations in structure and bonding that can occur at internal interfaces. Interpretation of such fluctuations requires only a knowledge of the location of the electron probe when the spectrum is acquired and a means of interpreting the spectrum. The location of the probe can be controlled with atomic precision in the STEM by the use of the Z-contrast image,while the real space cluster methodology of multiple scattering analysis is ideally suited to the task of interpretation. This approach is used here to derive 3-dimensional models for tilt grain boundaries in TiO_2 and SrTiO_3.
机译：芯损边缘的精细结构包含有关本地原子环境的详细信息。它可用作对内部接口处可能发生的结构和键合波动非常敏感的探针。解释这种涨落只需要了解获取光谱时电子探针的位置以及解释光谱的方法即可。通过使用Z对比图像，可以在STEM中以原子精度控制探针的位置，而多重散射分析的真实空间簇方法非常适合于解释任务。在此使用此方法来导出TiO_2和SrTiO_3中倾斜晶界的3维模型。

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