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首页> 外文会议>Symposium on Magnetic Ultrathin Films,Multilayers and Surface --1997 March 31-April 4,1997, San Francisco, California, U.S.A >Alteration of MCD spectra due to thin film interference effects
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Alteration of MCD spectra due to thin film interference effects

机译：由于薄膜干涉效应，MCD光谱发生变化

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摘要

MCD spectra at the M_2,3 edge of thin Fe films exhibit thickness-dependent variations in line shape as well as in the absolute MCD-effect. Our data indicate that more information is contained in the MCD spectra than simply the evolution of a magnetic moment and ferromagnetic order. We developed a model to predict line shape modulations as a function of film thickness and angle of light incidence. Using the Fresnel-Maxwell formalism we calculate interference effects between left and right circularly polarized light reflected from th evacuum-film-substrate interfaces which are verified by our MCD measurements. Since the observed interference effects are a function of the excitation wavelength, our results can be directly scaled to show the significance of these effects in the more commonly used L_2,3 region of 3d ferromagnets. Our data point out that one might be ill advisedto rely on L_2,3 MCD experiments to try to extract the formation of magnetic moments in films of several 10s of A in thickness.
机译：Fe薄膜的M_2,3边缘的MCD光谱在线形以及绝对MCD效应中表现出厚度依赖性变化。我们的数据表明，MCD光谱中包含的信息不仅仅是简单的磁矩和铁磁序的演化。我们开发了一个模型来预测线形调制与膜厚度和光入射角的关系。使用菲涅耳-麦克斯韦形式主义，我们计算了从真空薄膜-基板界面反射的左右圆偏振光之间的干涉效应，这已通过我们的MCD测量得到了验证。由于观察到的干扰效应是激发波长的函数，因此我们的结果可以直接缩放以显示这些效应在3d铁磁体的更常用L_2,3区域中的重要性。我们的数据指出，不建议使用L_2,3 MCD实验来尝试提取厚度为A的几十秒的薄膜中磁矩的形成。

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